TY  - RPRT
TI  - Modeling short-term synaptic depression in silicon.
AU  - Malte Boegerhausen
AU  - Pascal Suter
AU  - Shih-Chii Liu
PY  - 2003
DO  - 10.1162/089976603762552942
UR  - https://pubmed.ncbi.nlm.nih.gov/12590810/
ID  - 12590810
ER  -