TY  - RPRT
TI  - Profilometry based on two-photon absorption in a silicon avalanche photodiode.
AU  - Yosuke Tanaka
AU  - Naoya Sako
AU  - Takashi Kurokawa
AU  - Hiroyuki Tsuda
AU  - Mitsuo Takeda
PY  - 2003
DO  - 10.1364/ol.28.000402
UR  - https://pubmed.ncbi.nlm.nih.gov/12659260/
ID  - 12659260
ER  -