TY  - RPRT
TI  - Complexity of small silicon self-interstitial defects.
AU  - D A Richie
AU  - Jeongnim Kim
AU  - Stephen A Barr
AU  - Kaden R A Hazzard
AU  - Richard Hennig
AU  - John W Wilkins
PY  - 2004
DO  - 10.1103/physrevlett.92.045501
UR  - https://pubmed.ncbi.nlm.nih.gov/14995383/
ID  - 14995383
ER  -