TY  - RPRT
TI  - Characterizing single crystal surfaces using high resolution electron diffraction.
AU  - D Thien
AU  - F-J Meyer zu Heringdorf
AU  - P Kury
AU  - M Horn-von Hoegen
PY  - 2004
DO  - 10.1007/s00216-004-2547-8
UR  - https://pubmed.ncbi.nlm.nih.gov/14997266/
ID  - 14997266
ER  -