@misc{indiciaee033da811959,
  title = {New methods for semiconductor charge-diffusion-length measurements using synchrotron radiation.},
  author = {J Kohagura and T Cho and M Hirata and T Okamura and T Tamano and K Yatsu and S Miyoshi and K Hirano and H Maezawa},
  year = {1998},
  doi = {10.1107/s0909049597017524},
  url = {https://pubmed.ncbi.nlm.nih.gov/15263682/},
  note = {Source identifier: 15263682}
}