TY  - RPRT
TI  - A compact UHV X-ray diffractometer for studying surfaces and interfaces.
AU  - Y Fujii
AU  - T Nakamura
AU  - M Kai
AU  - K Yoshida
PY  - 1998
DO  - 10.1107/s0909049597014489
UR  - https://pubmed.ncbi.nlm.nih.gov/15263686/
ID  - 15263686
ER  -