@misc{indiciae70d2ef6d6273,
  title = {A Bayesian framework for multilead SMD post-placement quality inspection.},
  author = {Michael E Zervakis and Stefanos K Goumas and George A Rovithakis},
  year = {2004},
  doi = {10.1109/tsmcb.2003.817037},
  url = {https://pubmed.ncbi.nlm.nih.gov/15369085/},
  note = {Source identifier: 15369085}
}