@misc{indiciae88e853539e39,
  title = {Surface charge compensation for a highly charged ion emission microscope.},
  author = {J W McDonald and A V Hamza and M W Newman and J P Holder and D H G Schneider and T Schenkel},
  year = {2004},
  doi = {10.1016/j.ultramic.2004.06.008},
  url = {https://pubmed.ncbi.nlm.nih.gov/15450667/},
  note = {Source identifier: 15450667}
}