TY  - RPRT
TI  - Structured illumination microscopy: artefact analysis and reduction utilizing a parameter optimization approach.
AU  - L H Schaefer
AU  - D Schuster
AU  - J Schaffer
PY  - 2004
DO  - 10.1111/j.0022-2720.2004.01411.x
UR  - https://pubmed.ncbi.nlm.nih.gov/15516228/
ID  - 15516228
ER  -