@misc{indiciae475d2b92bc2f,
  title = {Reducing focused ion beam damage to transmission electron microscopy samples.},
  author = {Naoko I Kato},
  year = {2004},
  doi = {10.1093/jmicro/dfh080},
  url = {https://pubmed.ncbi.nlm.nih.gov/15582946/},
  note = {Source identifier: 15582946}
}