TY  - RPRT
TI  - Reducing focused ion beam damage to transmission electron microscopy samples.
AU  - Naoko I Kato
PY  - 2004
DO  - 10.1093/jmicro/dfh080
UR  - https://pubmed.ncbi.nlm.nih.gov/15582946/
ID  - 15582946
ER  -