TY  - RPRT
TI  - Atomic resolution STEM analysis of defects and interfaces in ceramic materials.
AU  - R F Klie
AU  - Y Zhu
PY  - 2005
DO  - 10.1016/j.micron.2004.12.003
UR  - https://pubmed.ncbi.nlm.nih.gov/15725591/
ID  - 15725591
ER  -