TY  - RPRT
TI  - Ghosting caused by bulk charge trapping in direct conversion flat-panel detectors using amorphous selenium.
AU  - Wei Zhao
AU  - G DeCrescenzo
AU  - Safa O Kasap
AU  - J A Rowlands
PY  - 2005
DO  - 10.1118/1.1843353
UR  - https://pubmed.ncbi.nlm.nih.gov/15789596/
ID  - 15789596
ER  -