TY  - RPRT
TI  - Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: a theoretical framework.
AU  - A J den Dekker
AU  - S Van Aert
AU  - A van den Bos
AU  - D Van Dyck
PY  - 2005
DO  - 10.1016/j.ultramic.2005.03.001
UR  - https://pubmed.ncbi.nlm.nih.gov/15982520/
ID  - 15982520
ER  -