TY  - RPRT
TI  - Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example.
AU  - S Van Aert
AU  - A J den Dekker
AU  - A van den Bos
AU  - D Van Dyck
AU  - J H Chen
PY  - 2005
DO  - 10.1016/j.ultramic.2005.03.002
UR  - https://pubmed.ncbi.nlm.nih.gov/15982521/
ID  - 15982521
ER  -