TY  - RPRT
TI  - Utilizing the charging effect in scanning electron microscopy.
AU  - Hai-Bo Zhang
AU  - Ren-Jian Feng
AU  - Katsumi Ura
PY  - 2004
DO  - 10.3184/003685004783238490
UR  - https://pubmed.ncbi.nlm.nih.gov/16028835/
ID  - 16028835
ER  -