TY  - RPRT
TI  - Gradient chemical micro patterns: a reference substrate for surface nanometrology.
AU  - Duangrut Julthongpiput
AU  - Michael J Fasolka
AU  - Wenhua Zhang
AU  - Tinh Nguyen
AU  - Eric J Amis
PY  - 2005
DO  - 10.1021/nl050612n
UR  - https://pubmed.ncbi.nlm.nih.gov/16089484/
ID  - 16089484
ER  -