@misc{indiciaef6448a0a4cb1,
  title = {Kondo effect in electromigrated gold break junctions.},
  author = {A A Houck and J Labaziewicz and E K Chan and J A Folk and I L Chuang},
  year = {2005},
  doi = {10.1021/nl050799i},
  url = {https://pubmed.ncbi.nlm.nih.gov/16159205/},
  note = {Source identifier: 16159205}
}