TY  - RPRT
TI  - Kondo effect in electromigrated gold break junctions.
AU  - A A Houck
AU  - J Labaziewicz
AU  - E K Chan
AU  - J A Folk
AU  - I L Chuang
PY  - 2005
DO  - 10.1021/nl050799i
UR  - https://pubmed.ncbi.nlm.nih.gov/16159205/
ID  - 16159205
ER  -