@misc{indiciae3a513bfbb551,
  title = {Electrical characterization of silicon tips using conducting atomic force microscopy.},
  author = {Xinxing Xiao and Zhongdang Xiao and Zuhong Lu},
  year = {2005},
  doi = {10.1166/jnn.2005.207},
  url = {https://pubmed.ncbi.nlm.nih.gov/16193992/},
  note = {Source identifier: 16193992}
}