TY  - RPRT
TI  - Electrical characterization of silicon tips using conducting atomic force microscopy.
AU  - Xinxing Xiao
AU  - Zhongdang Xiao
AU  - Zuhong Lu
PY  - 2005
DO  - 10.1166/jnn.2005.207
UR  - https://pubmed.ncbi.nlm.nih.gov/16193992/
ID  - 16193992
ER  -