TY  - RPRT
TI  - Si/Cu interface structure and adhesion.
AU  - Xiao-Gang Wang
AU  - John R Smith
PY  - 2005
DO  - 10.1103/physrevlett.95.156102
UR  - https://pubmed.ncbi.nlm.nih.gov/16241742/
ID  - 16241742
ER  -