@misc{indiciaefa28b9d919ae,
  title = {Defect analysis in crystals using X-ray topography.},
  author = {Balaji Raghothamachar and Govindhan Dhanaraj and Jie Bai and Michael Dudley},
  year = {2006},
  doi = {10.1002/jemt.20290},
  url = {https://pubmed.ncbi.nlm.nih.gov/16646013/},
  note = {Source identifier: 16646013}
}