TY  - RPRT
TI  - Defect analysis in crystals using X-ray topography.
AU  - Balaji Raghothamachar
AU  - Govindhan Dhanaraj
AU  - Jie Bai
AU  - Michael Dudley
PY  - 2006
DO  - 10.1002/jemt.20290
UR  - https://pubmed.ncbi.nlm.nih.gov/16646013/
ID  - 16646013
ER  -