TY  - RPRT
TI  - X-ray reflectivity study of semiconductor interfaces.
AU  - M K Sanyal
AU  - A Datta
AU  - S Banerjee
AU  - A K Srivastava
AU  - B M Arora
AU  - S Kanakaraju
AU  - S Mohan
PY  - 1997
DO  - 10.1107/s0909049596015312
UR  - https://pubmed.ncbi.nlm.nih.gov/16699227/
ID  - 16699227
ER  -