@misc{indiciae0de860168b44,
  title = {Focused ion beams techniques for nanomaterials characterization.},
  author = {Richard M Langford},
  year = {2006},
  doi = {10.1002/jemt.20324},
  url = {https://pubmed.ncbi.nlm.nih.gov/16739217/},
  note = {Source identifier: 16739217}
}