TY  - RPRT
TI  - Electron microscopy and diffraction of radiation-sensitive nanostructured materials.
AU  - A K Schaper
AU  - T Yoshioka
AU  - T Ogawa
AU  - M Tsuji
PY  - 2006
DO  - 10.1111/j.1365-2818.2006.01603.x
UR  - https://pubmed.ncbi.nlm.nih.gov/16911069/
ID  - 16911069
ER  -