@misc{indiciae4d84789b17c5,
  title = {A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples.},
  author = {Bo Yao and Rumyana V Petrova and Richard R Vanfleet and Kevin R Coffey},
  year = {2006},
  doi = {10.1093/jmicro/dfl027},
  url = {https://pubmed.ncbi.nlm.nih.gov/17040930/},
  note = {Source identifier: 17040930}
}