@misc{indiciaeb1b9c2a57a54,
  title = {Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges},
  author = {MJ Yoo and TA Fulton and HF Hess and RL Willett and LN Dunkleberger and RJ Chichester and LN Pfeiffer and KW West},
  year = {1997},
  doi = {10.1126/science.276.5312.579},
  url = {https://pubmed.ncbi.nlm.nih.gov/9110974/},
  note = {Source identifier: 9110974}
}