@misc{indiciae1eb52e335379,
  title = {Planar integrated optical methods for examining thin films and their surface adlayers.},
  author = {T E Plowman and S S Saavedra and W M Reichert},
  year = {1998},
  doi = {10.1016/s0142-9612(97)00113-0},
  url = {https://pubmed.ncbi.nlm.nih.gov/9677149/},
  note = {Source identifier: 9677149}
}