TY  - RPRT
TI  - Planar integrated optical methods for examining thin films and their surface adlayers.
AU  - T E Plowman
AU  - S S Saavedra
AU  - W M Reichert
PY  - 1998
DO  - 10.1016/s0142-9612(97)00113-0
UR  - https://pubmed.ncbi.nlm.nih.gov/9677149/
ID  - 9677149
ER  -