@misc{indiciae5e7b62873800,
  title = {High-Temperature In Situ Straining Experiments in the High-Voltage Electron Microscope.},
  author = {U Messerschmidt and D Baither and M Bartsch and B Baufeld and B Geyer and S Guder and A Wasilkowska and A Czyrska-Filemonowicz and M Yamaguchi and M Feuerbacher and K Urban},
  year = {1998},
  doi = {10.1017/s1431927698980229},
  url = {https://pubmed.ncbi.nlm.nih.gov/9767659/},
  note = {Source identifier: 9767659}
}