@misc{indiciaed46d1a7b9753,
  title = {Relative surface charge density mapping with the atomic force microscope.},
  author = {W F Heinz and J H Hoh},
  year = {1999},
  doi = {10.1016/s0006-3495(99)77221-8},
  url = {https://pubmed.ncbi.nlm.nih.gov/9876166/},
  note = {Source identifier: 9876166}
}