TY  - RPRT
TI  - Characterization of intermixing at metal-semiconductor interfaces by angle-resolved Auger-electron emission: Cu/Si(111)-7 x 7.
AU  - SA Chambers
AU  - GA Howell
AU  - TR Greenlee
AU  - JH Weaver
PY  - 1985
DO  - 10.1103/physrevb.31.6402
UR  - https://pubmed.ncbi.nlm.nih.gov/9935517/
ID  - 9935517
ER  -