TY  - RPRT
TI  - Electrical breakdown at semiconductor grain boundaries.
AU  - G Blatter
AU  - F Greuter
PY  - 1986
DO  - 10.1103/physrevb.34.8555
UR  - https://pubmed.ncbi.nlm.nih.gov/9939574/
ID  - 9939574
ER  -