@misc{indiciae2ea5690fd526,
  title = {Profile structures of very thin multilayers by x-ray diffraction using direct and refinement methods of analysis.},
  author = {V Skita and M Filipkowski and AF Garito and JK Blasie},
  year = {1986},
  doi = {10.1103/physrevb.34.5826},
  url = {https://pubmed.ncbi.nlm.nih.gov/9940424/},
  note = {Source identifier: 9940424}
}