TY  - RPRT
TI  - Profile structures of very thin multilayers by x-ray diffraction using direct and refinement methods of analysis.
AU  - V Skita
AU  - M Filipkowski
AU  - AF Garito
AU  - JK Blasie
PY  - 1986
DO  - 10.1103/physrevb.34.5826
UR  - https://pubmed.ncbi.nlm.nih.gov/9940424/
ID  - 9940424
ER  -