TY  - RPRT
TI  - Process-induced and gold acceptor defects in silicon.
AU  - A Mesli
AU  - E Courcelle
AU  - T Zundel
AU  - P Siffert
PY  - 1987
DO  - 10.1103/physrevb.36.8049
UR  - https://pubmed.ncbi.nlm.nih.gov/9942604/
ID  - 9942604
ER  -