TY  - RPRT
TI  - Local-field method for resistivity and electromigration in metallic microstructures: Application to thin films.
AU  - CS Chu
AU  - RS Sorbello
PY  - 1988
DO  - 10.1103/physrevb.38.7260
UR  - https://pubmed.ncbi.nlm.nih.gov/9945448/
ID  - 9945448
ER  -