TY  - RPRT
TI  - Defect parameters obtained from positron-annihilation and self-diffusion experiments in silicon.
AU  - P Varotsos
AU  - K Eftaxias
AU  - V Hadjicontis
PY  - 1988
DO  - 10.1103/physrevb.38.6328
UR  - https://pubmed.ncbi.nlm.nih.gov/9947106/
ID  - 9947106
ER  -