TY  - RPRT
TI  - Oxygen-diffusion-induced phase boundary migration in copper oxide thin films.
AU  - J Li
AU  - SQ Wang
AU  - JW Mayer
AU  - KN Tu
PY  - 1989
DO  - 10.1103/physrevb.39.12367
UR  - https://pubmed.ncbi.nlm.nih.gov/9948095/
ID  - 9948095
ER  -