TY  - RPRT
TI  - Spiking in a semiconductor device: Experiments and comparison with a model.
AU  - F Niedernostheide
AU  - H Schulze
AU  - S Bose
AU  - A Wacker
AU  - E Schöll
PY  - 1996
DO  - 10.1103/physreve.54.1253
UR  - https://pubmed.ncbi.nlm.nih.gov/9965193/
ID  - 9965193
ER  -