TY  - RPRT
TI  - Metal-overlayer-induced charge-transfer effects in thin SiO2-Si structures.
AU  - H Öfner
AU  - R Hofmann
AU  - J Kraft
AU  - FP Netzer
AU  - JJ Paggel
AU  - K Horn
PY  - 1994
DO  - 10.1103/physrevb.50.15120
UR  - https://pubmed.ncbi.nlm.nih.gov/9975863/
ID  - 9975863
ER  -