TY  - RPRT
TI  - Identifying and quantifying point defects in semiconductors using x-ray-absorption spectroscopy: Si-doped GaAs.
AU  - S Schuppler
AU  - DL Adler
AU  - LN Pfeiffer
AU  - KW West
AU  - EE Chaban
AU  - PH Citrin
PY  - 1995
DO  - 10.1103/physrevb.51.10527
UR  - https://pubmed.ncbi.nlm.nih.gov/9977747/
ID  - 9977747
ER  -