TY  - RPRT
TI  - Annealing effect on native-oxide/Si(111) interfaces studied by second-harmonic generation.
AU  - H Hirayama
AU  - K Watanabe
PY  - 1995
DO  - 10.1103/physrevb.51.14717
UR  - https://pubmed.ncbi.nlm.nih.gov/9978410/
ID  - 9978410
ER  -