@misc{indiciaec25fb98eba35,
  title = {Electrostatic tip-sample interaction in immersion force microscopy of semiconductors.},
  author = {C Donolato},
  year = {1996},
  doi = {10.1103/physrevb.54.1478},
  url = {https://pubmed.ncbi.nlm.nih.gov/9985977/},
  note = {Source identifier: 9985977}
}