TY  - RPRT
TI  - Electrostatic tip-sample interaction in immersion force microscopy of semiconductors.
AU  - C Donolato
PY  - 1996
DO  - 10.1103/physrevb.54.1478
UR  - https://pubmed.ncbi.nlm.nih.gov/9985977/
ID  - 9985977
ER  -