TY  - RPRT
TI  - Robust critical behavior in YBa2Cu3O7 thin films.
AU  - M Friesen
AU  - J Deak
AU  - L Hou
AU  - M McElfresh
PY  - 1996
DO  - 10.1103/physrevb.54.3525
UR  - https://pubmed.ncbi.nlm.nih.gov/9986256/
ID  - 9986256
ER  -