TY  - RPRT
TI  - Static charge fluctuations in Ga+-implanted silicon.
AU  - ZH Lu
AU  - A Yelon
PY  - 1990
DO  - 10.1103/physrevb.41.3284
UR  - https://pubmed.ncbi.nlm.nih.gov/9994118/
ID  - 9994118
ER  -