TY  - RPRT
TI  - Reaction and diffusion at Cu/Al interfaces studied using glancing-angle extended x-ray-absorption fine structures.
AU  - H Chen
AU  - SM Heald
PY  - 1990
DO  - 10.1103/physrevb.42.4913
UR  - https://pubmed.ncbi.nlm.nih.gov/9996051/
ID  - 9996051
ER  -